Tuesday, June 24, 2014

InP reference wafer, n type, AXP, N doped,

New unopened InP wafer from Shaul, American Xtal Tech, n-type
Cleave and mount sample, 3 kV 20 nA 30 tilt, "large hole" holder

C and O contamination, but P and In clear. Take survey CRR 5-10-15-20 and CAE 20

Tried REELS, 5 eV pass, apertures less important, 1400 nominal peak 1392.20 SCM on

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