samples
Dry transfer InP NW onto Si, wires grown by Shaul ~ last year (?)
Auger spectra
No obvious charging, pretty good spectra at 3 nA after careful realign. Max current not good, large spillover onto Si substrate.
Drift is an issue, works better splitting 50-580 eV spectra, 0.5 eV, 50 ms into two ~ 30 sec parts, otherwise drift off smaller 80-100 nm wide wires.
Mostly In, P, little C, little O, no sign of low energy Au peaks, used 3 kV.
Consider Auger maps, CAE 50, P 121.5 back 140; In 402.5 back 420
Scanning at slow speed shows "glitches", ~ 10 in a speed 11 90 sec frame. Float system, sublimator off, SE2 off, turbo off, no help.
No glitches scan speed 9 and below. In 2048 pixel, however, glitches at speed 9. I think at some scan speed Zeiss syncs to line frequency, this may be related to glitches.....
Auger scale 0.3 LP 6
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