Investigate behavior of auger electron optics
Clean Cu sample with piece of clean gold foil, 6 mm aperture, sloped edge, St. Steel plate
30 kV max current, tilted 30 degrees to analyzer.
SEM WD 9.3 mm
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Sample SE2, zoomed out to 72x, not rotated |
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Energy filtered image, #3 entrance slit 2 mm diameter, 2 kV at CRR 5 gain 0.05
analyzer is to image right |
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1 kV gain 0.2 |
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500 eV gain 0.4 shifted 0.7 mm 23 degrees |
Edge of Au foil visible in upper left of auger image, translate sample, move foil away, no change in Auger image, helps rule out magnetization or charging of sample holder plate
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400 eV gain 0.6 shifted 0.8 mm |
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300 eV gain 0.8 shifted 1.2 mm 14 degrees |
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same as above CRR 20 gain 2.0, imaging qualities degraded with more decel |
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200 eV gain 1.2 displaced 1.8 mm 13 degrees |
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above corrected (-5,-1)% deflection, (-2, -0.4) Volts |
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100 eV gain 1.5 same deflection as above |
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Counts optimized at center, (-4.2,-0.7) instead of (-5,-1), counts up ~50% |
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80 V CRR 5 same def |
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slower scan for S/N, shift x def -4,2 to -4.1 10% gain in counts, only 40 mV change. "ripples" also visible in image |
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slit #1 full open, gain 0.3, 80 V CRR5 |
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optimize counts in center -5.0, +0.4, count rate 850 kHz to 1120 kHz |
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Shadow of bar that opens tip transfer holder, tilt 25 degrees, 50 eV CRR 3, 3 kV max beam |
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Green spectrum in shadow, white spectrum with sample translated in +Y/F2 direction (toward wobble stick) 3 kV max current ~ 17 nA, tilt 25 |
SEM scan rotated 180 degrees so bottom is wobble stick, top is STM, left is analyzer, right is x-ray, positive tilt to left
It is absolutely clear that the tip-transfer holder bar does block low KE electrons, depending on stage position and angle. Using the wobble stick to pull the sample slightly out of the stage (2-3 mm) lets the center region of the sample be seen by Auger
Now low KE spectra work on AuSi dewetting sample, before this failed due to stage interference.
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