Thursday, November 8, 2012

Dewetting experiments continued

directory 121108 SiAu

Si reference

  • Take SiO sputter sample to get Si reference. Look near region sputtered last week.
  • Get Inlens detector working. At 3 kV, very bright region is SiO, darker regions SiC. No clean Si seen
  • Sputter sample 2 kV 3x3 raster 20 mPa cond 66 obj 61 grid 150 30 degree tilt
Problem - sputter issues, sample current does not change much, no SE in Auger.
  • almost no SE signal
  • sample current 2 nA for 2 kV ions. Change to 2.5 kV, now 260 nA, reasonable SE signal 250 kHz CRR 5 at 80 eV
  • 2500 V does give reasonable sputter rate. Remove C and O with ~ 150 sec sputter
  • also discover software for FIG5 has timer for sputter...
Take reference spectra 121108 SiAu.aes, Si LVV and KLL regions at 3 kV and 10 kV.
  • Si KLL ~ 1% peak for 3 kV, ~ 40% for 10 kV. Spectra in CRR and CAE
  • Good quality Si data

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